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Found 1 from your keywords: subject="nanoteknologi"
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"Metrology and Diagnostic Techniques for Nanoelectronics|
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Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. Thi…

Edisi
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ISBN/ISSN
9789814745086
Deskripsi Fisik
xli, 1411 hlm.: ilus.; 23.4 cm.
Judul Seri
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No. Panggil
620.5 MET m