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"Metrology and Diagnostic Techniques for Nanoelectronics|

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topic in semiconductor R&D and manufacturing.

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7908.1"
Tersedia
Informasi Detail
Judul Seri
-
No. Panggil
620.5 MET m
Penerbit
Temasek Boulevard, Singapore : Pan Stanford Publishing.,
Deskripsi Fisik
xli, 1411 hlm.: ilus.; 23.4 cm.
Bahasa
English
ISBN/ISSN
9789814745086
Klasifikasi
620,5
Tipe Isi
-
Tipe Media
-
Tipe Pembawa
-
Edisi
-
Subjek
nanoteknologi
Info Detail Spesifik
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Pernyataan Tanggungjawab
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